The processing and characterization of Pb(Mg1/3Nb2/3)O3 (PMN) powders for coating capacitor
Materials Science in Semiconductor Processing, cilt.31, sa.1, ss.325-333, 2015 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 31 Sayı: 1
- Basım Tarihi: 2015
- Doi Numarası: 10.1016/j.mssp.2014.11.048
- Dergi Adı: Materials Science in Semiconductor Processing
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.325-333
- Anahtar Kelimeler: Capacitance, Coating, Dielectric, PMN
- Ankara Yıldırım Beyazıt Üniversitesi Adresli: Hayır
Özet
© 2014 Elsevier Ltd. All rights reserved.The present paper extensively demonstrates synthesis, characterization and electrical properties of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3 (PMN) sub-micron powders and PMN coatings on n-type Si substrates using sol-gel technique for capacitor applications. Transparent solutions were prepared from Pb, Mg and Nb based precursors, methanol and glacial acetic acid (GAA). The obtained solutions were dried at 80°C for 60 min in air to form gel structure of PMN mixture and heat treated at 530°C for 3 h and subsequently annealed at the temperature range of 800°C and 1000°C for 2 h in air. After the sintering, the PMN powders were milled for 24 h to obtain sub-micron powders. The powder size was measured using particle size machine. Finally, the powders were dispersed in alcohol and the obtained suspension was coated on n-type Si substrates. The films were dried at 50°C for 15 min and subsequently were heat treated at 730°C for 30 min in air to ensure its adhesion strength. Thermal, structural, microstructural, mechanical and electrical properties of the powder and the coatings were characterized by differential thermal analysis-thermo gravimeter (DTA/TG), Fourier transform infrared (FT-IR), X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), refractometer, spectrophotometer and high resolution dielectric analyzer machines. The study provides a new insight on the sub-micron powders of PMN structure coated on Si semiconducting surface.