In situ Measurement via E M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors

KAMAŞ T., BİLGİN M. S., ARDIÇ M., TÜFEKÇİOĞLU A., ÖLMEZ Z.

International Journal of Engineering Technologies, IJET, cilt.1, sa.2, 2015 (Hakemli Dergi)