In situ Measurement via E M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors

KAMAŞ T., BİLGİN M. S., ARDIÇ M., TÜFEKÇİOĞLU A., ÖLMEZ Z.

International Journal of Engineering Technologies, IJET, vol.1, no.2, 2015 (Peer-Reviewed Journal)

• Publication Type: Article / Article
• Volume: 1 Issue: 2
• Publication Date: 2015
• Journal Name: International Journal of Engineering Technologies, IJET
• Ankara Yıldırım Beyazıt University Affiliated: Yes