Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method

GÜZELDİR B., SAĞLAM M., Ateş A.

Microelectronics Reliability, vol.51, no.12, pp.2179-2184, 2011 (SCI-Expanded, Scopus) identifier

  • Publication Type: Article / Article
  • Volume: 51 Issue: 12
  • Publication Date: 2011
  • Doi Number: 10.1016/j.microrel.2011.04.020
  • Journal Name: Microelectronics Reliability
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.2179-2184
  • Ankara Yıldırım Beyazıt University Affiliated: No