Fluctuating in the hopping rate of CuO thin films with respect to substrate temperature

Serin N., Yildiz A., Cam E., Uzun S., Serin T.

SUPERLATTICES AND MICROSTRUCTURES, vol.52, no.4, pp.759-764, 2012 (SCI-Expanded, Scopus) identifier identifier

  • Publication Type: Article / Article
  • Volume: 52 Issue: 4
  • Publication Date: 2012
  • Doi Number: 10.1016/j.spmi.2012.06.011
  • Journal Name: SUPERLATTICES AND MICROSTRUCTURES
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.759-764
  • Ankara Yıldırım Beyazıt University Affiliated: Yes

Abstract

Electrical transport properties in CuO thin films processed using d.c. magnetron sputtering technique is investigated to understand the correlation between the processing conditions and electrical properties. It is identified that the temperature dependent conductivity of the investigated films is controlled by the multi-phonon hopping conduction mechanism. A detailed analysis in terms of carrier hopping parameters is used to correlate electrical transport properties with the d.c. magnetron sputtering conditions. (C) 2012 Elsevier Ltd. All rights reserved.