Fluctuating in the hopping rate of CuO thin films with respect to substrate temperature
SUPERLATTICES AND MICROSTRUCTURES, cilt.52, sa.4, ss.759-764, 2012 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 52 Sayı: 4
- Basım Tarihi: 2012
- Doi Numarası: 10.1016/j.spmi.2012.06.011
- Dergi Adı: SUPERLATTICES AND MICROSTRUCTURES
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.759-764
- Ankara Yıldırım Beyazıt Üniversitesi Adresli: Evet
Özet
Electrical transport properties in CuO thin films processed using d.c. magnetron sputtering technique is investigated to understand the correlation between the processing conditions and electrical properties. It is identified that the temperature dependent conductivity of the investigated films is controlled by the multi-phonon hopping conduction mechanism. A detailed analysis in terms of carrier hopping parameters is used to correlate electrical transport properties with the d.c. magnetron sputtering conditions. (C) 2012 Elsevier Ltd. All rights reserved.