Negative Differential Resistance Observation and a New Fitting Model for Electron Drift Velocity in GaN-Based Heterostructures

Atmaca G., Narin P., Kutlu E., Malin T. V., Mansurov V. G., Zhuravlev K. S., ...More

IEEE Transactions on Electron Devices, vol.65, no.3, pp.950-956, 2018 (SCI-Expanded, Scopus)

• Publication Type: Article / Article
• Volume: 65 Issue: 3
• Publication Date: 2018
• Doi Number: 10.1109/ted.2018.2796501
• Journal Name: IEEE Transactions on Electron Devices
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.950-956
• Open Archive Collection: AVESIS Open Access Collection
• Ankara Yıldırım Beyazıt University Affiliated: No