Annealing Temperature-Driven Evolution of Structure, Morphology, and Optical Behavior in Cu-TiO2 Composite Films
Silicon, cilt.17, sa.17, ss.3843-3853, 2025 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 17 Sayı: 17
- Basım Tarihi: 2025
- Doi Numarası: 10.1007/s12633-025-03452-y
- Dergi Adı: Silicon
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Chemical Abstracts Core, Compendex, INSPEC
- Sayfa Sayıları: ss.3843-3853
- Anahtar Kelimeler: Annealing temperature, Copper-Titanium oxide composite, Sol–gel deposition, Thin films
- Ankara Yıldırım Beyazıt Üniversitesi Adresli: Evet
Özet
In the present study, we investigate how varying annealing temperatures affect the structural, morphological, and optical properties of copper-titanium oxide composite films deposited on quartz substrates. A range of characterization techniques, including X-ray diffraction, Raman spectroscopy, scanning electron microscopy, atomic force microscopy, and UV–Vis spectroscopy, were employed to analyze the changes in film characteristics. The results demonstrate that annealing temperature plays a critical role in determining the film’s structural integrity, surface morphology, and optical behavior. The crystallite size increased from 16.97 nm at 500 °C to 68.07 nm at 900 °C, while surface roughness rose significantly, reaching 148 nm at 1000 °C. In addition, SEM analysis showed that particle size expanded from 12.55 nm at 400 °C to 603.60 nm at 900 °C. Notably, a strong relationship was found between film transparency and these physical properties, with optical transmittance decreasing from approximately 69% at 400 °C to around 2% at 1000 °C. Based on the findings, the study proposes optimal annealing conditions for achieving high-quality thin films.