The nonlinear and saturable absorption characteristics of Ga 0.90In0.10Se and Ga0.85In0.15Se semiconductor crystals and their amorphous thin films

KARATAY A., Aksoy C., YAĞLIOĞLU H. G., ELMALI A., Kurum U., Ates A., ...More

Journal of Optics, vol.13, no.7, 2011 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 13 Issue: 7
  • Publication Date: 2011
  • Doi Number: 10.1088/2040-8978/13/7/075203
  • Journal Name: Journal of Optics
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Keywords: nonlinear absorption, pump-probe, saturable absorption, Semiconductor, Z-scan
  • Ankara Yıldırım Beyazıt University Affiliated: Yes


We investigated the nonlinear and saturable absorption characteristics of Ga0.90In0.10Se and Ga0.85In0.15Se semiconductor crystals and their very thin amorphous films by open aperture (OA) Z-scan and pump-probe techniques. The linear absorption spectra indicated a blue shift in energy with increasing film thickness. This can be attributed to the quantum confinement effect. For both 4ns and 65ps pulse durations the two photon absorption coefficients of Ga0.90In0.10Se and Ga0.85In0.15Se crystals increased with increasing input intensities. The life time of the localized defect states was measured as 3ns for both Ga0.90In0.10Se and Ga0.85In 0.15Se films while it was around 10ns for GaSe and InSe films. Open aperture Z-scan experiments with a 4ns pulse duration did not exhibit any saturable absorption behavior for thin films since the life time of localized defect states was not long enough to saturate these films. Thinner films exhibited saturable absorption and thicker films exhibited nonlinear absorption for a 65ps pulse duration. This behavior was attributed to increasing localized defect states with increasing film thickness. The experimental curves were fitted to the theory of the open aperture Gaussian-beam Z-scan based on the Adomian decomposition method incorporating one photon, two photon, and free carrier absorptions and their saturations. The lowest saturation intensity threshold for the Ga0.90In0.10Se film was found to be 1.38 × 102MWcm- 2 for 43nm film thickness. © 2011 IOP Publishing Ltd.