Research Information System
2002 Applied Superconductivity Conference, Houston, TX, United States Of America, 4 - 09 August 2002, vol.13, pp.2673-2676
Textured Cerium Oxide (CeO2)/Yttrium-Stabilized Zirconia (YSZ)/CeO2 buffer layers structure were grown by sol-gel dip coating process on bi-axially textured Ni tapes for processing of YBCO coated conductors. CeO2/YSZ/CeO2 buffer layer structure has been demonstrated by vacuum techniques, but first time textured CeO2/YSZ/CeO2 structure were grown by sol-gel on biaxially textured Ni tape. The buffer layer structure promoted c-axis oriented sol-gel YBCO films and prevented oxidation of nickel during YBCO processing. After each layer was coated, the layer was annealed. CeO2 layers were annealed at 950°C for 30 min. and YSZ layers were annealed at 1150°C for 10 min. under 4% H2-Ar gas flow. Texture analysis of Ni substrates and bottom CeO2 were done by Philips diffractometer. Sol-gel YBCO layers were coated on CeO2/YSZ/CeO2 structure and critical current density was about 0.5 × 105 A/cm2. Microstructure of the buffer layer was investigated by Environmental Scanning Electron Microscope (ESEM).