In situ hot-stage ESEM evaluation of CeO2 buffer layers on Ni tapes for YBCO coated conductors

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ÇELİK E., Hascicek Y. S.

Materials Science and Engineering B: Solid-State Materials for Advanced Technology, vol.94, no.2-3, pp.176-180, 2002 (SCI-Expanded)

• Publication Type: Article / Article
• Volume: 94 Issue: 2-3
• Publication Date: 2002
• Doi Number: 10.1016/s0921-5107(02)00069-7
• Journal Name: Materials Science and Engineering B: Solid-State Materials for Advanced Technology
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.176-180
• Keywords: Buffer layers and YBCO, CeO2, Sol-gel
• Ankara Yıldırım Beyazıt University Affiliated: Yes

Abstract

CeO2 coatings have been prepared on Ni tapes from solutions derived from Ce-based precursors using a sol-gel method for YBCO coated conductors. The surface morphology and structure of coatings were characterized using in situ Hot-Stage Environmental Scanning Electron Microscope (ESEM) and X-ray diffraction (XRD). Crack size and crack propagation rate of these coatings were determined using in situ Hot-Stage ESEM depending on temperature at certain time. It has been found that the size and propagation rate of cracks of these coatings increased with increasing process temperature. © 2002 Elsevier Science B.V. All rights reserved.