In situ hot-stage ESEM evaluation of CeO2 buffer layers on Ni tapes for YBCO coated conductors
Materials Science and Engineering B: Solid-State Materials for Advanced Technology, cilt.94, sa.2-3, ss.176-180, 2002 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 94 Sayı: 2-3
- Basım Tarihi: 2002
- Doi Numarası: 10.1016/s0921-5107(02)00069-7
- Dergi Adı: Materials Science and Engineering B: Solid-State Materials for Advanced Technology
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.176-180
- Anahtar Kelimeler: Buffer layers and YBCO, CeO2, Sol-gel
- Ankara Yıldırım Beyazıt Üniversitesi Adresli: Hayır
Özet
CeO2 coatings have been prepared on Ni tapes from solutions derived from Ce-based precursors using a sol-gel method for YBCO coated conductors. The surface morphology and structure of coatings were characterized using in situ Hot-Stage Environmental Scanning Electron Microscope (ESEM) and X-ray diffraction (XRD). Crack size and crack propagation rate of these coatings were determined using in situ Hot-Stage ESEM depending on temperature at certain time. It has been found that the size and propagation rate of cracks of these coatings increased with increasing process temperature. © 2002 Elsevier Science B.V. All rights reserved.