Chemically synthesis and characterization of MnS thin films by SILAR method


YILDIRIM M. A. , Yildirim S. T. , Cavanmirza I. , Ates A.

Chemical Physics Letters, vol.647, pp.73-78, 2016 (Journal Indexed in SCI Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 647
  • Publication Date: 2016
  • Doi Number: 10.1016/j.cplett.2016.01.048
  • Title of Journal : Chemical Physics Letters
  • Page Numbers: pp.73-78

Abstract

MnS thin films were synthesized on glass substrates using SILAR method. The film thickness effect on structural, morphological, optical and electrical properties of the films was investigated. The X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) studies showed that all the films exhibited polycrystalline nature with beta-MnS structure and were covered well on glass substrates. The bandgap and resistivity values of the films decreased from 3.39 eV to 2.92 eV and from 11.84 x 10(6) to 2.21 x 105 Omega-cm as the film thickness increased from 180 to 350 nm, respectively. The refractive index (n) and dielectric constants (epsilon(o), epsilon(infinity)) values were calculated. (C) 2016 Elsevier B.V. All rights reserved.