Modelling of the effective dielectric constant of planar spoof surface plasmon polariton waveguides


Unutmaz M. A. , Unlu M.

Electronics Letters, vol.53, no.21, pp.1418-1420, 2017 (Journal Indexed in SCI Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 53 Issue: 21
  • Publication Date: 2017
  • Doi Number: 10.1049/el.2017.2360
  • Title of Journal : Electronics Letters
  • Page Numbers: pp.1418-1420

Abstract

© The Institution of Engineering and Technology 2017.The modelling of the effective dielectric constant of a planar spoof surface plasmon polariton waveguide for X-band frequencies is presented. The waveguide has a single conductor structure that is corrugated on both sides. A methodology to extract the effective dielectric constant of waveguides with complex patterns and a novel closedform formula based on complex analysis of the structure and empirical methods are suggested. The suggested formula is a function of the corrugation depth, aperture, periodicity, thickness of the substrate material and permittivity. The worst case error between the formula and measurement result is 8.4%, which is much lower than the previously reported coplanar stripline formulation approach having an error of 14.5%.