Characterization of buffer layers on Ni-based substrates for YBCO superconductors


Canadian Metallurgical Quarterly, vol.49, no.1, pp.81-90, 2010 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 49 Issue: 1
  • Publication Date: 2010
  • Doi Number: 10.1179/cmq.2010.49.1.81
  • Journal Name: Canadian Metallurgical Quarterly
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.81-90
  • Keywords: Buffer layers, Sol-gel, Superconductivity
  • Ankara Yıldırım Beyazıt University Affiliated: Yes


Metal oxide buffer layers provide a continuous, smooth textured and chemically inert surface for growth of the YBCO (YBa2Cu 3O7.,) film and prevent metal diffusion from the substrate into the superconductor. CeO2, Gd2O3 and Eu2O3 buffer layers were grown on metallic Ni substrates using a sol-gel method by using metal 2,4-pentanedionate and acetate precursors. The films were annealed at 1150°C under 4%H2-Ar gas mixture. Textured, crack free and continuous buffer layers were obtained through the sol-gel technique. Prior to the coating process, solution characterization was performed by turbidimeter, pH meter, contact angle goniometer and rheometer. Heat treatment profiles were determined by using DTA-TG and FTIR. The coated layers were characterized by means of XRD, SEMEDS, AFM and a scratch tester. As a result, textured growth of CeO2, Eu2O3 and Gd2O3 thin films on textured Ni tapes by the sol-gel dip coating process were successfully performed. © Canadian Institute of Mining, Metallurgy and Petroleum.