Extraction of important electrical parameters of CuO

Serin T., YILDIZ A., Horzum Ahin S., Serin N.

Physica B: Condensed Matter, vol.406, no.3, pp.575-578, 2011 (SCI-Expanded, Scopus) identifier

  • Publication Type: Article / Article
  • Volume: 406 Issue: 3
  • Publication Date: 2011
  • Doi Number: 10.1016/j.physb.2010.11.044
  • Journal Name: Physica B: Condensed Matter
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.575-578
  • Keywords: Compensation ratio, CuO, Dip coating technique, Electrical parameters
  • Ankara Yıldırım Beyazıt University Affiliated: Yes

Abstract

Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications. © 2010 Elsevier B.V. All rights reserved.