Extraction of important electrical parameters of CuO

Serin T., YILDIZ A., Horzum Ahin S., Serin N.

Physica B: Condensed Matter, cilt.406, sa.3, ss.575-578, 2011 (SCI-Expanded, Scopus)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 406 Sayı: 3
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1016/j.physb.2010.11.044
  • Dergi Adı: Physica B: Condensed Matter
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.575-578
  • Anahtar Kelimeler: Compensation ratio, CuO, Dip coating technique, Electrical parameters
  • Ankara Yıldırım Beyazıt Üniversitesi Adresli: Evet

Özet

Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications. © 2010 Elsevier B.V. All rights reserved.